Department of Electrical and Electronics Engineering

RESEARCH

Publications

 
TypeInternational publicationNational publicationTotal
Conference paper11
Total:101
 

#	Title	Publication	Author(s)	Type	Indexed in SCI, SSCI, AHCI or EI?	Year
1	Defect Classification from Electronic Card Images by Deep Learning	2020 28th Signal Processing and Communications Applications Conference (SIU)	M. Ery�lmaz, M. �il, S. Akt�rk, M. Tile�i, H. T�rak, A. Y�lmaz, S.E. Y�ksel, D. G�kcen	Conference paper		May 2022

Title	Defect Classification from Electronic Card Images by Deep Learning
Publication	2020 28th Signal Processing and Communications Applications Conference (SIU)
Publisher	IEEE
Author(s)	M. Ery�lmaz, M. �il, S. Akt�rk, M. Tile�i, H. T�rak, A. Y�lmaz, S.E. Y�ksel, D. G�kcen
Type	Conference paper
Page	4
Date	May 2022
Volume
Number
Address	https://ieeexplore.ieee.org/document/9864727
URL
Origin	International publication
Language	in Turkish
Indexed in SCI, SSCI, AHCI or EI?